Vol. 14, no.1, 2022
РусскийEnglish
NANOELECTRONICS
Classical and intelligent approaches for VLSI static timing analysis: an overview
Nikolay O. Vasilyev, Mariya A. Zapletina, Galina A. Ivanova
Institute for Design Problems in Microelectronic of Russian Academy of Sciences http://www.ippm.ru/
Zelenograd, Moscow 124365, Russian Federation
E-mail: vasilyev_n@ippm.ru, zapletina_m@ippm.ru, ivanova_g@ippm.ru
Received September 25, 2021, peer-reviewed October 11, 2021, accepted October 25, 2021
Abstract: The paper systematizes the modern scientific and technical experience of VLSI timing analysis. It provides a comparative overview of some existing classical and intelligent methods of static timing analysis, as well as identifies actual tasks and directions for future investigation. The special attention is paid to the intelligent methods for reducing the pessimism of the integrated circuits’ static timing analysis results. In particular, an elimination of the false paths and the technological and operational parameters variations are considered. According to recent publications (issued in 2013-2021), various types of neural networks and regression analysis tools are often used to build intelligent methods for estimating the timing characteristics of integrated circuits. In a number of works aimed at reducing the pessimism of classical static timing analysis, the advantage of ensemble methods is argued. It is noted that methods of this type demonstrate more accurate results compared to single methods in conditions of insufficient training data.
Keywords: static timing analysis, statistical static timing analysis, intelligent methods, artificial intelligence, machine learning, false paths, Signal Integrity
UDC 621.3.049.771.14
RENSIT, 2022, 14(1):27-38 DOI: 10.17725/rensit.2022.14.027.
Full-text electronic version of this article - web site http://en.rensit.ru/vypuski/article/431/14(1)27-38e.pdf